DocumentCode :
1350958
Title :
Six-band k/spl middot/p approach to the effects of doping on energy dispersion in p-type strained In/sub 0.15/Ga/sub 0.85/As-Al/sub 0.33/Ga/sub 0.67/As quantum-well structures
Author :
Shi, W. ; Zhang, Dao Hua ; Osotchan, Tanakorn
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
36
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
835
Lastpage :
841
Abstract :
We report an application of the six-band Luttinger-Kohn model to the subband energy dispersions in the valence band for the p-type In/sub 0.15/Ga/sub 0.85/As-Al/sub 0.33/Ga/sub 0.67/As quantum-well (QW) structures. It was found that, in addition to the contentional biaxial compressive strain related to the lattice constant and well width of the structures, the p-type doping also caused a shift of the subband energy levels in the valence band by varying the barrier height. It was also found that the strain of the QW structures was not a constant but was sensitive to the p-type doping density, which also induced the shift of the subband energy levels. The calculated results, based on intersubband transitions of the heavy holes and taking the doping-related changes in strain and barrier height into account, were in good agreement with the experimental data, measured using Fourier transform infrared technique.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; k.p calculations; semiconductor quantum wells; valence bands; Fourier transform infrared spectroscopy; In/sub 0.15/Ga/sub 0.85/As-Al/sub 0.33/Ga/sub 0.67/As; In/sub 0.15/Ga/sub 0.85/As-Al/sub 0.33/Ga/sub 0.67/As quantum well; Luttinger-Kohn model; barrier height; compressive strain; intersubband transition; lattice constant; p-type doping density; six-band k/spl middot/p model; subband energy dispersion; valence band; Capacitive sensors; Dispersion; Doping; Effective mass; Electromagnetic wave absorption; Energy states; Infrared detectors; Quantum wells; Semiconductor materials; Strain measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.848356
Filename :
848356
Link To Document :
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