DocumentCode :
1351167
Title :
From Fault-Tree To Fault-Identification
Author :
Kiss, Lidia
Author_Institution :
Hungarian Academy of Sciences, Budapest; Research Institute for Technical Chemistry; POBox 98; H-1502 Budapest, HUNGARY.
Issue :
5
fYear :
1983
Firstpage :
422
Lastpage :
425
Abstract :
A practical way is given of identifying actual faults, by using a fault tree´s complete system of minimal cutsets. For instance, for a fault tree where 20 cutsets are considered with 30 possible primal events, any of them can be found in at most three steps by the proposed FID-algorithm.
Keywords :
Boolean algebra; Delay; Fault diagnosis; Fault trees; Fires; Reliability engineering; System testing; Temperature; Boolean algebra; Fault identification; Fault tree;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1983.5221719
Filename :
5221719
Link To Document :
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