DocumentCode :
13513
Title :
An Ultra-Low Phase Noise Class-F 2 CMOS Oscillator With 191 dBc/Hz FoM and Long-Term Reliability
Author :
Babaie, Masoud ; Staszewski, Robert Bogdan
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Delft, Netherlands
Volume :
50
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
679
Lastpage :
692
Abstract :
In this paper, we propose a new class of operation of an RF oscillator that minimizes its phase noise. The main idea is to enforce a clipped voltage waveform around the LC tank by increasing the second-harmonic of fundamental oscillation voltage through an additional impedance peak, thus giving rise to a class-F 2 operation. As a result, the noise contribution of the tail current transistor on the total phase noise can be significantly decreased without sacrificing the oscillator´s voltage and current efficiencies. Furthermore, its special impulse sensitivity function (ISF) reduces the phase sensitivity to thermal circuit noise. The prototype of the class-F 2 oscillator is implemented in standard TSMC 65 nm CMOS occupying 0.2 mm 2 . It draws 32-38 mA from 1.3 V supply. Its tuning range is 19% covering 7.2-8.8 GHz. It exhibits phase noise of -139 dBc/Hz at 3 MHz offset from 8.7 GHz carrier, translated to an average figure-of-merit of 191 dBc/Hz with less than 2 dB variation across the tuning range. The long term reliability is also investigated with estimated >10 year lifetime.
Keywords :
CMOS integrated circuits; LC circuits; circuit tuning; harmonic analysis; integrated circuit noise; phase noise; radiofrequency oscillators; sensitivity analysis; thermal noise; FoM; ISF; LC tank; RF oscillator; TSMC; clipped voltage waveform; complementary metal-oxide semiconductor; current 32 mA to 38 mA; figure-of-merit; frequency 7.2 GHz to 8.8 GHz; fundamental oscillation voltage; impedance peak; impulse sensitivity function; long-term reliability; phase noise minimization; phase sensitivity; radiofrequency oscillator; second-harmonic oscillation; size 65 nm; tail current transistor; thermal circuit noise; tuning range; ultralow phase noise class-F2 CMOS oscillator; voltage 1.3 V; Harmonic analysis; Impedance; Phase noise; Resonant frequency; Tuning; Class-F$_{2}$ oscillator; VCO; differential/common mode resonant frequencies; digitally controlled oscillator; impulse sensitivity function; oscillator reliability; phase noise; transformer;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2379265
Filename :
7006708
Link To Document :
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