• DocumentCode
    1351302
  • Title

    Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data

  • Author

    Wei, Duan ; Chen, C.Y.

  • Author_Institution
    Institute of Business Administration; National Sun Yat-sen University Kaohsiung, TAIWAN.
  • Issue
    5
  • fYear
    1983
  • Firstpage
    492
  • Lastpage
    495
  • Abstract
    The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power.
  • Keywords
    Exponential distribution; Gaussian distribution; Monte Carlo methods; Power system reliability; Probability; Reliability theory; Statistical analysis; Statistical distributions; System testing; Weibull distribution; Exponential distribution; Gaussian distribution; Goodness-of-fit test statistic; Power comparison;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1983.5221740
  • Filename
    5221740