Title :
Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data
Author :
Wei, Duan ; Chen, C.Y.
Author_Institution :
Institute of Business Administration; National Sun Yat-sen University Kaohsiung, TAIWAN.
Abstract :
The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power.
Keywords :
Exponential distribution; Gaussian distribution; Monte Carlo methods; Power system reliability; Probability; Reliability theory; Statistical analysis; Statistical distributions; System testing; Weibull distribution; Exponential distribution; Gaussian distribution; Goodness-of-fit test statistic; Power comparison;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1983.5221740