DocumentCode
1351302
Title
Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data
Author
Wei, Duan ; Chen, C.Y.
Author_Institution
Institute of Business Administration; National Sun Yat-sen University Kaohsiung, TAIWAN.
Issue
5
fYear
1983
Firstpage
492
Lastpage
495
Abstract
The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power.
Keywords
Exponential distribution; Gaussian distribution; Monte Carlo methods; Power system reliability; Probability; Reliability theory; Statistical analysis; Statistical distributions; System testing; Weibull distribution; Exponential distribution; Gaussian distribution; Goodness-of-fit test statistic; Power comparison;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1983.5221740
Filename
5221740
Link To Document