• DocumentCode
    1351325
  • Title

    Extraction of the Wideband Dielectric Properties of a Material Layer Using Measured Natural Frequencies

  • Author

    Rothwell, Edward J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    58
  • Issue
    2
  • fYear
    2010
  • Firstpage
    620
  • Lastpage
    623
  • Abstract
    A new experimental technique for determining the complex permittivity of a dielectric material is introduced. A conductor-backed dielectric sheet is illuminated by a transient plane wave in a free-space measurement range and the temporal reflected field is analyzed as a natural mode series. By comparing the natural frequencies extracted from the response to those found theoretically using a simple dispersion model, the permittivity of the sheet may be determined over a broad band of frequencies. Since the natural frequencies are not affected by the waveform of the incident field, they remain a robust descriptor of the permittivity even after the requisite calibration steps. Examples of the low-loss dielectrics polyvinyl chloride, acrylic, and garolite are examined.
  • Keywords
    conductors (electric); frequency measurement; iron alloys; permittivity; silicon alloys; acrylic; complex permittivity; conductor-backed dielectric sheet; free-space measurement range; garolite; low-loss dielectrics polyvinyl chloride; material layer; natural frequency extraction; natural frequency measurement; natural mode series; transient plane wave illumination; wideband dielectric property extraction; Calibration; Conducting materials; Dielectric materials; Dielectric measurements; Frequency measurement; Permittivity measurement; Robustness; Sheet materials; Transient analysis; Wideband; Dielectric materials; dielectric measurements; electromagnetic reflection; electromagnetic transient scattering; materials testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2009.2038184
  • Filename
    5350650