DocumentCode :
1351325
Title :
Extraction of the Wideband Dielectric Properties of a Material Layer Using Measured Natural Frequencies
Author :
Rothwell, Edward J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
58
Issue :
2
fYear :
2010
Firstpage :
620
Lastpage :
623
Abstract :
A new experimental technique for determining the complex permittivity of a dielectric material is introduced. A conductor-backed dielectric sheet is illuminated by a transient plane wave in a free-space measurement range and the temporal reflected field is analyzed as a natural mode series. By comparing the natural frequencies extracted from the response to those found theoretically using a simple dispersion model, the permittivity of the sheet may be determined over a broad band of frequencies. Since the natural frequencies are not affected by the waveform of the incident field, they remain a robust descriptor of the permittivity even after the requisite calibration steps. Examples of the low-loss dielectrics polyvinyl chloride, acrylic, and garolite are examined.
Keywords :
conductors (electric); frequency measurement; iron alloys; permittivity; silicon alloys; acrylic; complex permittivity; conductor-backed dielectric sheet; free-space measurement range; garolite; low-loss dielectrics polyvinyl chloride; material layer; natural frequency extraction; natural frequency measurement; natural mode series; transient plane wave illumination; wideband dielectric property extraction; Calibration; Conducting materials; Dielectric materials; Dielectric measurements; Frequency measurement; Permittivity measurement; Robustness; Sheet materials; Transient analysis; Wideband; Dielectric materials; dielectric measurements; electromagnetic reflection; electromagnetic transient scattering; materials testing;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2009.2038184
Filename :
5350650
Link To Document :
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