Abstract :
Burn-in is an important screening method used in predicting, achieving, and enhancing field reliability. Although electronics burn-in has been studied qualitatively, no comprehensive quantitative approach exists for determining optimal burn-in periods. This paper presents a cost-optimization model from a system viewpoint, with burn-in periods for the components as the decision variables. This model is applied to an electronic product recently developed which uses many ICs. State-of-the-art ICs have high early-failure rates and long infant mortality periods. Proper use of burn-in reduces early failure rates and reduces system deployment costs. The total cost to be minimized is formulated as a function of the mean costs of the component, device burn-in, shop repair, and field repair, which in turn are functions of the mean number of failures during and after burn-in. Component and system reliability are constraints that have to be satisfied. The early device failures are assumed to have a Weibull distribution. The formulated problem, with failure rates and cost factors, is optimized. Some basic properties of reliability and cost functions are discussed.
