Title :
Error Vector Magnitude as a Performance Measure for Advanced Modulation Formats
Author :
Schmogrow, Rene ; Nebendahl, Bernd ; Winter, Marcus ; Josten, Arne ; Hillerkuss, David ; Koenig, Swen ; Meyer, Joachim ; Dreschmann, Michael ; Huebner, Michael ; Koos, Christian ; Becker, Juergen ; Freude, Wolfgang ; Leuthold, Juerg
Author_Institution :
Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
We examine the relation between optical signal-to-noise ratio (OSNR), error vector magnitude (EVM), and bit-error ratio (BER). Theoretical results and numerical simulations are compared to measured values of OSNR, EVM, and BER. We conclude that the EVM is an appropriate metric for optical channels limited by additive white Gaussian noise. Results are supported by experiments with six modulation formats at symbol rates of 20 and 25 GBd generated by a software-defined transmitter.
Keywords :
Gaussian noise; error statistics; laser noise; numerical analysis; optical modulation; optical transmitters; white noise; additive white Gaussian noise; advanced modulation formats; bit-error ratio; error vector magnitude; optical channels; optical signal-to-noise ratio; performance measurement; software-defined transmitter; Adaptive optics; Bit error rate; Modulation; Optical noise; Optical receivers; Optical transmitters; Signal to noise ratio; Advanced modulation formats; bit-error ratio (BER); error vector magnitude (EVM); software defined transmitter;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2011.2172405
