• DocumentCode
    1351511
  • Title

    New generation 1200 V power module with trench gate IGBT and super soft recovery diode and its evaluations

  • Author

    Lwamoto, H. ; Kawakami, A. ; Satoh, K. ; Takahashi, H. ; Nakaoka, M.

  • Author_Institution
    Mitsubishi Electr. Co., Fukuoka, Japan
  • Volume
    147
  • Issue
    3
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    153
  • Lastpage
    158
  • Abstract
    A 1200 V IGBT with trench gate and punch through structures is developed on the basis of simulation and experimental analyses. Both results of simulation and measurement of the prototype device have good agreement. Though the chip area of the new IGBT is about 30-50% smaller than that of the conventional IGBT, the saturation voltage is about 30-40% lower, the switching loss is also about 20%, smaller than those of conventional IGBT, respectively, and the new IGBT has a larger reverse bias safe operating area (RBSOA). Capability to withstand short circuits is achieved by a new current limiting circuit. In addition, a fast switching diode with an excellent soft recovery characteristic is practically developed by using local lifetime control processing in the anode side n-layer. As an experimental result, its power dissipation, spike surge voltage and electromagnetic noise can be lowered. The structures and characteristics of the developed IGBT, diode and power module are presented, and their analytical results are discussed and evaluated from a practical and an applications point of view
  • Keywords
    insulated gate bipolar transistors; power bipolar transistors; power semiconductor diodes; power semiconductor switches; semiconductor device measurement; semiconductor device models; semiconductor device testing; 1200 V; current limiting circuit; electromagnetic noise; fast switching diode; power dissipation; power module; reverse bias safe operating area; saturation voltage; short circuit withstand; spike surge voltage; super soft recovery diode; switching loss; trench gate IGBT;
  • fLanguage
    English
  • Journal_Title
    Electric Power Applications, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2352
  • Type

    jour

  • DOI
    10.1049/ip-epa:20000331
  • Filename
    848537