Title :
s-Shaped Software Reliability Growth Models and Their Applications
Author :
Yamada, Shigeru ; Ohba, Mitsuru ; Osaki, Shunji
Author_Institution :
Graduate School of Systems Science; Okayama University of Science; 1-1 Ridai-cho Okayama 700 JAPAN.
Abstract :
The s-shaped growth curves of detected software errors can be observed in software testing. The delayed s-shaped and inflection s-shaped software reliability growth models based on a nonhomogeneous Poisson process are discussed. The software reliability growth types of the models are investigated in terms of the error detection rate per error. In addition, a viable method for the software quality assessment, which integrates the capture-recapture method and the models above, is discussed, and its application to actual test data is illustrated.
Keywords :
Application software; Computer errors; Delay estimation; Error analysis; Logistics; Programming; Software quality; Software reliability; Software testing; Stochastic processes; Capture-recapture method; Delayed s-shaped SRGM; Inflection s-shaped SRGM; Nonhomogeneous Poisson process (NHPP); Software product quality level (SPQL); Software reliability growth model (SRGM); s-Shaped growth;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1984.5221826
