Title :
Distribution of LRT for Testing the Equality of Several 2-Parameter Exponential Distributions
Author :
Nagarsenker, Brahmanand N. ; Nagarsenker, Panna B.
Author_Institution :
Department of Mathematics; Air Force Institute of Technology; Wright-Patterson AFB, Ohio 45433, USA.
fDate :
4/1/1985 12:00:00 AM
Abstract :
Exact distribution of the likelihood-ratio-test (LRT) criterion for testing the equality of several 2-parameter exponential distributions is obtained for the first time in a computational closed form. This is then used to obtain the s-significance points of the LRT.
Keywords :
Art; Distributed computing; Exponential distribution; Light rail systems; Military computing; Monte Carlo methods; Reliability theory; Statistical analysis; Statistical distributions; Testing; Exact distribution; Exponential distribution; Likelihood ratio test;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1985.5221933
