Title :
Implementation of BIC monitor in balanced analogue self-test
Author :
Sidiropulos, M. ; Stopjakova, V. ; Manhaeve, H.
Author_Institution :
Dept. of Microelectron., Tech. Univ. of Brno, Brno, Czech Republic
fDate :
9/26/1996 12:00:00 AM
Abstract :
The authors present the design of a dynamic built-in current (BIC) monitor for a new on-chip analogue self-test methodology. This methodology uses dynamic power supply current monitoring, and takes advantage of a redundancy in the structure of fully balanced circuits. The dynamic BIC monitor is based on a second generation current conveyor CCII+, and offers accurate measurement of supply current with minimal degradation in power supply voltage
Keywords :
analogue integrated circuits; automatic testing; built-in self test; current conveyors; electric current measurement; integrated circuit testing; monitoring; BIC monitor; CCII; balanced analogue self-test; dynamic built-in current monitor; dynamic power supply current monitoring; fully balanced circuits; onchip analogue self-test methodology; redundancy; second generation current conveyor; supply current measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961297
