• DocumentCode
    1352618
  • Title

    Optimal Selection Methods for Failure & Repair Rates Using Nomographs

  • Author

    Sasaki, Masafumi ; Kuwahara, Yasuo

  • Author_Institution
    Professor; Department of Electrical Engineering; The National Defense Academy; Yokosuka 239, JAPAN.
  • Issue
    2
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    154
  • Lastpage
    161
  • Abstract
    This paper explains the optimal selection methods using nomographs to solve two essentially different problems. The one is the problem of unit level, and the other is the one of system level. The unit level assumes that the cost information as a function of failure rate ¿ and repair rate ¿ are empirically known. The paper presents a method, by which a nomograph is used to select easily the optimum pair from the infinitely many pairs (¿, ¿) of feasible solutions, to gain the required unit availability at minimum cost of this assumption. At the system level, the system is composed of n serial i-units which are selectable from a group provided for each i-unit (i = 1, 2, ..., n), several different repair plans are available for the unit. Each unit has a specific failure rate and associated cost, and each repair plan has a specific repair rate and associated cost. There are service personnel for each unit. The failure and repair rates are constant. The paper presents: 1) A method using nomographs to select the optimum pairs from the many pairs (¿i, ¿i) (i = 1, 2, ..., n) of feasible solutions, to gain the required system availability at the minimum system cost, 2) A method to select the optimum pairs, from the many pairs (¿i, ¿i (i = 1, 2, .
  • Keywords
    Availability; Cost function; Design optimization; Maintenance; Personnel; Reliability engineering; Cost; Hot-standby system availability; How to draw nomographs; System level availability; System-level nomograph; Unit level availability; Unit-level nomograph;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1985.5221978
  • Filename
    5221978