• DocumentCode
    1352873
  • Title

    Tuning the Threshold Voltage of Double-Gate Low-Voltage Transparent Oxide-Based TFTs by a Lateral In-Plane Gate

  • Author

    Sun, Jia ; Jiang, Jie ; Dou, Wei ; Wan, Qing

  • Author_Institution
    Ningbo Inst. of Mater. Technol. & Eng., Ningbo, China
  • Volume
    32
  • Issue
    12
  • fYear
    2011
  • Firstpage
    1710
  • Lastpage
    1712
  • Abstract
    Double-gate low-voltage transparent oxide-based thin-film transistors (TFTs) with a lateral in-plane gate are self aligned by only one metal shadow mask. The threshold voltage of such devices can be tuned in a wide range from -1.07 to 0.78 V by the lateral in-plane gate, which allows the device switching from a depletion to an enhancement-mode operation. High performance with a field-effect mobility of >; 10 cm2/V · s, a current on/off ratio of ~3 × 105, and a low subthreshold swing of ~195 mV/decade is obtained at various voltage biases of the in-plane gate. Such double-gate TFTs are promising for next-generation transparent electronics with low power consumption.
  • Keywords
    masks; power consumption; thin film transistors; double-gate low-voltage transparent oxide-based TFT; double-gate low-voltage transparent oxide-based thin-film transistors; field-effect mobility; lateral in-plane gate; metal shadow mask; next-generation transparent electronics; power consumption; threshold voltage; voltage -1.07 V to 0.78 V; Charge carrier density; Indium tin oxide; Logic gates; Optical saturation; Thin film transistors; Threshold voltage; Double gate; self-aligned; threshold voltage modulation; transparent transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2169644
  • Filename
    6051467