An 8-b ADC with over-Nyquist input at 300-Ms/s conversion rate

Author

Nejime, Yoshito ; Hotta, Masao ; Ueda, Seiichi

Author_Institution

Hitachi Ltd., Tokyo, Japan

Volume

26

Issue

9

fYear

1991

fDate

9/1/1991 12:00:00 AM

Firstpage

1302

Lastpage

1308

Abstract

An 8-b flash analog-digital (A/D) converter (ADC) LSI for high-speed data acquisition systems such as digital oscilloscopes and wave digitizers is described. This converter can convert analog input signals over the Nyquist frequency (up to 200 MHz) at a conversion rate of 300 megasamples per second (Ms/s) without glitch errors. In addition, it can be operated at up to 440 Ms/s when input frequency is as low as 100 kHz. This ADC is fabricated by a 2.5-μm, 10-GHz f_T, Si bipolar technology called the advanced sidewall base contact structure (advanced SICOS) technology. For high-performance glitch error suppression, an inhibitory circuit and a comparator design with an inner clock buffer are developed. Both techniques require few hardware additions

Keywords

analogue-digital conversion; bipolar integrated circuits; elemental semiconductors; large scale integration; silicon; 100 kHz to 200 MHz; 2.5 micron; A/D convertor LSI; Si bipolar technology; advanced SICOS; comparator design; conversion rate; digital oscilloscopes; flash ADC; glitch error suppression; high-speed data acquisition systems; inhibitory circuit; inner clock buffer; over-Nyquist input; sidewall base contact structure; wave digitizers; Bandwidth; Circuits; Clocks; Data acquisition; Frequency conversion; Hardware; Large scale integration; Latches; Oscilloscopes; Power dissipation;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.84948

Filename

84948