Title :
Simulating the current mirror with a self-heating BJT model
Author :
Munro, Philip C. ; Ye, Fang-Qiu
Author_Institution :
Electr. Eng., Youngstown State Univ., OH, USA
fDate :
9/1/1991 12:00:00 AM
Abstract :
A Gummel-Poon (GP) BJT (bipolar junction transistor) model that includes self-heating is presented, and a current-mirror circuit is used to show its significance. Self-heating thermal effects are modeled by a simple electrical analog circuit, which also provides BJT junction temperature as part of the CAD solution. Both discrete-BJT and IC mirror circuits are tested. The self-heating model correctly simulates the temperature stability of the IC mirror circuit where the BJTs are in close thermal proximity. For the discrete-BJT circuit, a standard GP model produces errors up to 84% versus 6.1% for the self-heating model
Keywords :
amplifiers; bipolar integrated circuits; bipolar transistor circuits; circuit analysis computing; linear integrated circuits; semiconductor device models; stability; thermal analysis; CAD solution; Gummel-Poon model; IC; bipolar junction transistor; discrete-BJT; electrical analog circuit; junction temperature; self-heating BJT model; temperature stability; thermal effects; Analog circuits; Bipolar transistor circuits; Circuit simulation; Circuit stability; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Mirrors; Temperature; Thermal stability;
Journal_Title :
Solid-State Circuits, IEEE Journal of
