• DocumentCode
    1353690
  • Title

    2012 IEEE International Reliabilty Physics Symposium (IRPS)

  • Volume
    58
  • Issue
    11
  • fYear
    2011
  • Firstpage
    4116
  • Lastpage
    4116
  • Abstract
    Provides a listing of upcoming conference events of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2172703
  • Filename
    6052190