• DocumentCode
    1353807
  • Title

    Improving the Accuracy of the Littlewood-Verrall Model

  • Author

    Catuneanu, Vasile M. ; Mihalache, Adrian N.

  • Author_Institution
    Polytechnic Institute Bucharest; Dept of Electronics; Splaiul Independentei 303; Bucharest, R. S. ROMANIA.
  • Issue
    5
  • fYear
    1985
  • Firstpage
    418
  • Lastpage
    421
  • Abstract
    A Bayes model of a system with stochastically monotonous failure rate, proposed by Littlewood & Verrall, has been tested in a simulated experiment. We show that the model can be improved by introducing pseudo-failures in order to enrich the input data. This leads to a greater accuracy in most predictions and makes the model more adaptive to the data.
  • Keywords
    Accuracy; Analytical models; Failure analysis; Monte Carlo methods; Predictive models; Shape; Software reliability; Software testing; System testing; Uncertainty; Bayes analysis; Littlewood-Verrall model; Monte Carlo simulation; Pseudo-failure; Software reliability;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1985.5222220
  • Filename
    5222220
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1353807