Title :
A Low Area, Switched-Resistor Based Fractional-N Synthesizer Applied to a MEMS-Based Programmable Oscillator
Author :
Perrott, Michael H. ; Pamarti, Sudhakar ; Hoffman, Eric G. ; Lee, Fred S. ; Mukherjee, Shouvik ; Lee, Cathy ; Tsinker, Vadim ; Perumal, Sathi ; Soto, Benjamin T. ; Arumugam, Niveditha ; Garlepp, Bruno W.
Author_Institution :
SiTime Corp., Sunnyvale, CA, USA
Abstract :
MEMS-based oscillators have recently become a topic of interest as integrated alternatives are sought for quartz-based frequency references. When seeking a programmable solution, a key component of such systems is a low power, low area fractional-N synthesizer, which also provides a convenient path for compensating changes in the MEMS resonant frequency with temperature and process. We present several techniques enabling efficient implementation of this synthesizer, including a switched-resistor loop filter topology that avoids a charge pump and boosts effective resistance to save area, a high gain phase detector that lowers the impact of loop filter noise, and a switched capacitor frequency detector that provides initial frequency acquisition. The entire synthesizer with LC VCO occupies less than 0.36sq. mm in 0.18 m CMOS. Chip power consumption is 3.7 mA at 3.3 V supply (20 MHz output, no load).
Keywords :
CMOS integrated circuits; micromechanical devices; network topology; resistors; voltage-controlled oscillators; CMOS; LC VCO; MEMS-based programmable oscillator; current 3.7 mA; fractional-n synthesizer; quartz-based frequency references; size 0.18 mum; switched-resistor loop filter topology; voltage 3.3 V; Capacitors; Microelectromechanical systems; Oscillators; Phase detection; Phase locked loops; Resistors; Switched capacitor circuits; MEMS; fractional-N synthesizer; frequency acquisition; frequency detection; high gain phase detector; loop filter; oscillator; phase detection; phase-locked loop (PLL); reference frequency; switched capacitor; switched resistor; temperature stable;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2076570