Title :
IRAS, An Interactive Reliability Analysis System for Electronic Circuits
Author :
Brombacher, A.C. ; Peeters, Ir.W.F.J.
Author_Institution :
BS; Department of Electronics; Twente University of Technology; Postbox 217; 7500 AE Enschede; The NETHERLANDS.
Abstract :
IRAS is a general purpose reliability analysis program for evaluating the reliability of electronic circuits in various ways, viz, part count, part count using DC stress, extended FMECA. It uses MIL-HDBK-217D procedures. IRAS runs on an IBM PC/XT computer.
Keywords :
Art; Capacitors; Circuit simulation; Electronic circuits; Failure analysis; Internal stresses; Libraries; Resistors; Temperature; Computer-aided circuit analysis; FMECA;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1985.5222247
