Title :
Special Section on the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC´09)
Author :
Kiang, Jean-Fu ; Kharkovsky, Sergey
Author_Institution :
National Taiwan University, Taipei, Taiwan
Abstract :
The six articles in this special issue were originally presented at the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC´09), held at the Oriental Institute of Technology, Taipei, Taiwan, on June 24-26, 2009.
Keywords :
Electromagnetic fields; Electromagnetic measurements; Meetings; Near-field radiation pattern; Special issues and sections;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2010.2078250
