DocumentCode :
1354008
Title :
Dynamical Properties and Design Analysis for Nonvolatile Memristor Memories
Author :
Ho, Yenpo ; Huang, Garng M. ; Li, Peng
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
58
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
724
Lastpage :
736
Abstract :
Novel nonvolatile universal memory technology is essential for providing required storage for nanocomputing. As a potential contender for the next-generation memory, the recently found "the missing fourth circuit element," memristor, has drawn a great deal of research interests. In this paper, by starting from basic memristor device equations, we develop a comprehensive set of properties and design equations for memristor based memories. Our analyses are specifically targeting key electrical memristor device characteristics relevant to memory operations. Using our derived properties, we investigate the design of read and write circuits and analyze important data integrity and noise-tolerance is sues.
Keywords :
memristors; random-access storage; circuit element; data integrity analysis; design equations; key electrical memristor device characteristics; memristor device equations; nanocomputing; next-generation memory; noise-tolerance; nonvolatile memristor memory design analysis; read-write circuits; Conductivity; Equations; Mathematical model; Memristors; Nonvolatile memory; Resistance; Shape; Charge-controlled memristance; flux-controlled memristance; zero-net charge injection; zero-net flux injection;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2010.2078710
Filename :
5604689
Link To Document :
بازگشت