• DocumentCode
    1354008
  • Title

    Dynamical Properties and Design Analysis for Nonvolatile Memristor Memories

  • Author

    Ho, Yenpo ; Huang, Garng M. ; Li, Peng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    58
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    724
  • Lastpage
    736
  • Abstract
    Novel nonvolatile universal memory technology is essential for providing required storage for nanocomputing. As a potential contender for the next-generation memory, the recently found "the missing fourth circuit element," memristor, has drawn a great deal of research interests. In this paper, by starting from basic memristor device equations, we develop a comprehensive set of properties and design equations for memristor based memories. Our analyses are specifically targeting key electrical memristor device characteristics relevant to memory operations. Using our derived properties, we investigate the design of read and write circuits and analyze important data integrity and noise-tolerance is sues.
  • Keywords
    memristors; random-access storage; circuit element; data integrity analysis; design equations; key electrical memristor device characteristics; memristor device equations; nanocomputing; next-generation memory; noise-tolerance; nonvolatile memristor memory design analysis; read-write circuits; Conductivity; Equations; Mathematical model; Memristors; Nonvolatile memory; Resistance; Shape; Charge-controlled memristance; flux-controlled memristance; zero-net charge injection; zero-net flux injection;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2010.2078710
  • Filename
    5604689