Title :
Adaptive digital correction of analog errors in MASH ADCs. II. Correction using test-signal injection
Author :
Kiss, Péter ; Silva, José ; Wiesbauer, Andreas ; Sun, Tao ; Moon, Un-Ku ; Stonick, John T. ; Temes, Gabor C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
fDate :
7/1/2000 12:00:00 AM
Abstract :
For pt. I see ibid., vol. 47, no. 7, p. 621-8 (2000). This part describes a different adaptation strategy. It relies on the injection of a pseudorandom two-level test signal at the input of the first-stage quantizer, where it is added to the quantization noise. The test signal then leaks into the output signal, where it can be detected and used to control the digital noise-cancellation filter. This paper describes the correction process, as well as some efficient structures for implementing it, and demonstrates the effectiveness of the technique by describing three design examples
Keywords :
adaptive signal processing; analogue-digital conversion; error correction; integrated circuit noise; MASH ADCs; adaptive digital correction; design examples; first-stage quantizer; noise-cancellation filter; output signal; pseudorandom two-level test signal; quantization noise; test-signal injection; Analog circuits; Analog-digital conversion; Circuit noise; Error correction; Leak detection; Moon; Multi-stage noise shaping; Quantization; Sun; Testing;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on