Adaptive digital correction of analog errors in MASH ADCs. II. Correction using test-signal injection

Author

Kiss, Péter ; Silva, José ; Wiesbauer, Andreas ; Sun, Tao ; Moon, Un-Ku ; Stonick, John T. ; Temes, Gabor C.

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

47

Issue

7

fYear

2000

fDate

7/1/2000 12:00:00 AM

Firstpage

629

Lastpage

638

Abstract

For pt. I see ibid., vol. 47, no. 7, p. 621-8 (2000). This part describes a different adaptation strategy. It relies on the injection of a pseudorandom two-level test signal at the input of the first-stage quantizer, where it is added to the quantization noise. The test signal then leaks into the output signal, where it can be detected and used to control the digital noise-cancellation filter. This paper describes the correction process, as well as some efficient structures for implementing it, and demonstrates the effectiveness of the technique by describing three design examples

Keywords

adaptive signal processing; analogue-digital conversion; error correction; integrated circuit noise; MASH ADCs; adaptive digital correction; design examples; first-stage quantizer; noise-cancellation filter; output signal; pseudorandom two-level test signal; quantization noise; test-signal injection; Analog circuits; Analog-digital conversion; Circuit noise; Error correction; Leak detection; Moon; Multi-stage noise shaping; Quantization; Sun; Testing;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.850422

Filename

850422