Title :
Effective frequency-domain ADC testing
Author :
Carbone, P. ; Petri, D.
Author_Institution :
Dipt. di Ingegneria Elettronica e dell´´Inf., Perugia Univ., Italy
fDate :
7/1/2000 12:00:00 AM
Abstract :
Frequency domain based analog-to-digital converter testing is addressed in this brief. It proposes a design technique based on a suitable class of window functions. The resulting testing procedure is characterized by robustness to model uncertainties, high accuracy, low computational burden, and ease of use
Keywords :
analogue-digital conversion; frequency-domain analysis; integrated circuit modelling; integrated circuit testing; ADC testing; accuracy; computational burden; design technique; frequency-domain testing; model uncertainties; testing procedure; window functions; Analog-digital conversion; Circuit testing; Discrete Fourier transforms; Distortion measurement; Fourier transforms; Frequency; Robustness; Sampling methods; System testing; Uncertainty;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on