Title :
Nonlinear Steady-State III–V FET Model for Microwave Antenna Switch Applications
Author :
Takatani, Shinichiro ; Chen, Cheng-Duan
Author_Institution :
WIN Semicond. Corp., Tao Yuan Shien, Taiwan
Abstract :
A nonlinear III-V field-effect transistor model is proposed for designing microwave antenna switches and related circuits, off-state gate and drain capacitance values of a pseudo-morphic high-electron-mobility transistor (HEMT) derived from pulsed S-parameters with a deep OFF-state quiescent gate voltage are found to be much less voltage dependent than capacitance values measured by a nonpulsed bias owing to trap-induced dispersion effects. Our device model based on pulsed-bias CV characteristics accurately simulates switch nonlinearity. Both gate and drain capacitance values are assumed to be nonlinear, and a charge expression is developed for model implementation. For both capacitance values, a nonpulsed-bias CV curve is also utilized to maintain accurate capacitance at the quiescent voltage and, thus, accurate simulation of off-switch isolation. Additional terms are introduced to an existing drain current model to improve accuracy at high Vgs/low Vds and subthreshold regions. Furthermore, the model is extended to multiple-gate devices. Harmonics generated from both OFF- and ON-state switches, insertion loss, and isolation are accurately predicted for both single- and multiple-gate HEMTs.
Keywords :
III-V semiconductors; S-parameters; field effect transistor switches; high electron mobility transistors; microwave antennas; microwave switches; HEMT; drain capacitance values; field-effect transistor model; microwave antenna switch applications; nonlinear steady-state III-V FET model; off-state gate; pseudomorphic high-electron-mobility transistor; pulsed S-parameters; pulsed-bias CV characteristics; subthreshold regions; Capacitance; FETs; Integrated circuit modeling; Logic gates; Polynomials; Switches; Voltage measurement; Field-effect transistor (FET) switches; harmonic distortion (HD); microwave switches; modeling; nonlinear distortion;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2169415