DocumentCode
1354179
Title
Some Aspects of Reliability Growth
Author
Gottfried, Paul
Author_Institution
Consultant; 9251 Three Oaks Drive; Silver Spring, Maryland 20901 USA.
Issue
1
fYear
1987
fDate
4/1/1987 12:00:00 AM
Firstpage
11
Lastpage
16
Abstract
Reliability growth is examined with the use of a variant of the Duane model. This variant is based on stepwise growth and avoids some of the mathematical and philosophic dificulties associated with the Duane model. Monte Carlo simulation, while confirming the noisy behavior of reliability growth data, indicates that central tendencies are sufficiently strong to justify the use of Gaussian approximations for analysis of some aspects of growth. Some exact methods and some approximations for parameter estimation are presented.
Keywords
Gaussian approximation; Gaussian noise; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Silver; Springs; Stochastic processes; Testing; Vehicles; Duane model; Point process; Reliability growth;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1987.5222284
Filename
5222284
Link To Document