Title :
Extraction of Dielectric Constant and Loss Tangent Using New Rapid Plane Solver and Analytical Debye Modeling for Printed Circuit Boards
Author_Institution :
Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
Abstract :
Dielectric material properties of printed circuit boards (PCBs) are needed by designers working in various areas such as signal integrity, antennas, and embedded RF components. Among many methods to extract the material properties, the full sheet resonance technique is commonly used on PCBs due to its simplicity. The disadvantage of this method is that an analytical equation is used to extract the dielectric constant, which is accurate only for lossless dielectrics. In this paper, a new method is presented to solve the inaccuracy issue of the extraction of the dielectric constant by applying customized electromagnetic simulation based on a new rapid plane solver instead of analytical equations. For PCB dielectrics, the loss tangent tends to be flat over several decades. The dielectric constant then varies as a function of frequency based on the Kronig-Kramers relations. This paper introduces a new Debye type of a model for the complex permittivity of such dielectrics. The parameters of the Debye model can be obtained analytically without requiring any curve fitting. The resulting Debye model can then be easily integrated in SPICE or a finite-difference time-domain simulator.
Keywords :
dielectric materials; finite difference time-domain analysis; permittivity; printed circuits; Kronig-Kramers relations; PCB dielectrics; SPICE; analytical Debye modeling; antennas; curve fitting; customized electromagnetic simulation; dielectric constant; dielectric material property; dielectric permittivity; embedded RF components; finite-difference time-domain simulator; full sheet resonance technique; loss tangent; printed circuit boards; rapid plane solver; signal integrity; Causality; complex permittivity; debye; dielectric constant; flat sheet resonance; loss tangent; rapid solver; vector fitting;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2009.2036338