Title :
Correlation between anomalous latch-up I/V characteristics and observation of current distribution by IR microscopy in CMOS ICs
Author :
Canali, Carlo ; Corsi, F. ; Zanoni, Enrico ; Muschitiello, Michele
Author_Institution :
Dipartimento di Elettronica ed Inf., Padova Univ.
fDate :
2/18/1988 12:00:00 AM
Abstract :
IR microscopy allows the correlation of anomalous latch-up electrical characteristics with current distribution in CMOS ICs, showing that anomalous behaviour is due to the competition of different pnpn paths and consequent current redistribution
Keywords :
CMOS integrated circuits; current distribution; integrated circuit testing; optical microscopy; CMOS ICs; IR microscopy; anomalous latch-up; characteristics; current distribution; current redistribution; pnpn paths;
Journal_Title :
Electronics Letters
