DocumentCode :
1354535
Title :
A nondestructive breakdown phenomenon in selenium rectifiers
Author :
English, A. C. ; Tobin, W. H.
Author_Institution :
University of California, Berkeley, Calif.
Volume :
79
Issue :
1
fYear :
1960
fDate :
3/1/1960 12:00:00 AM
Firstpage :
9
Lastpage :
14
Abstract :
Under conditions of excessive current or voltage overload a rectifier will exhibit some form of breakdown. Under practical conditions, breakdown is normally destructive although, with proper safeguards, it may be controlled. A voltage-induced electric breakdown is the type most commonly cited in theory, while in practice a considerable contribution from thermal effects is observed. Selenium rectifiers frequently exhibit the property of recovering from an overvoltage breakdown. The symptoms in this case range from the appearance of minor sparking and fumes of selenium to a very generous arc blowing a cavity in one of the cells. Two physical mechanisms of recovery are apparent; in one, small areas of separation occur between the selenium and the counter-electrode, without necessarily rupturing the latter; in the other, greater burnouts involve craters reaching down to the baseplate, with walls of insulating vitreous selenium, and all counter-electrode removed from the immediate vicinity.
Keywords :
Electric breakdown; Junctions; Rectifiers; Resistance; Temperature measurement; Temperature sensors; Voltage measurement;
fLanguage :
English
Journal_Title :
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
Publisher :
ieee
ISSN :
0097-2452
Type :
jour
DOI :
10.1109/TCE.1960.6368533
Filename :
6368533
Link To Document :
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