• DocumentCode
    1354723
  • Title

    High mobility tri-layer a-Si:H thin-film transistors with ultrathin active layer

  • Author

    Thomasson, D.B. ; Jackson, T.N.

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    18
  • Issue
    8
  • fYear
    1997
  • Firstpage
    397
  • Lastpage
    399
  • Abstract
    We show that hydrogenated amorphous silicon thin-film transistors (a-Si:H TFT´s) with active layer thickness of 13 nm perform better for display applications than devices with thicker 50-nm active layers. A direct comparison of a-Si:H TFT´s fabricated using an i-stopper TFT structure shows that ultrathin active layers significantly improve the device characteristics. For a 5-μm channel length TFT, the linear region (V/sub DS/=0.1 V) and saturation region mobilities increase from 0.4 cm2/V/spl middot/s and 0.7 cm2/V/spl middot/s for a 50-nm thick active layer a-Si:H device to 0.7 cm2/V/spl middot/s and 1.2 cm2/V/spl middot/s for a 13-nm thick active layer a-Si:H layer device fabricated with otherwise identical geometry and processing.
  • Keywords
    amorphous semiconductors; carrier mobility; elemental semiconductors; hydrogen; silicon; thin film transistors; AMLCD; Si:H; carrier mobility; hydrogenated amorphous silicon; i-stopper; linear region; saturation region; tri-layer a-Si:H thin-film transistor; ultrathin active layer; Active matrix liquid crystal displays; Amorphous silicon; Crystalline materials; Dielectric substrates; Etching; Geometry; Liquid crystal displays; Manufacturing; Passivation; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.605452
  • Filename
    605452