DocumentCode :
1354826
Title :
R&M 2000 Environmental Stress Screening
Author :
Littlefield, John W.
Author_Institution :
Reliability and Maintainability Engineering Department; Litton Guidance and Control Systems Division; 5500 Canoga Avenue; Woodland Hills, California 91365 USA.
Issue :
3
fYear :
1987
Firstpage :
335
Lastpage :
341
Abstract :
This paper is concerned with the impact on the US defense industry of the US Air Force R&M 2000 plan and other efforts for a dramatic improvement in the reliability and life-cycle cost of military systems. The paper generally discusses the aims and techniques of environmental stress screening (ESS) with quantitative examples from experience gained at the Litton Guidance and Control Systems Division.
Keywords :
Contracts; Control systems; Costs; Electronic switching systems; Life testing; Mathematical model; Stress control; System testing; Temperature; Thermal stresses; Defect precipitation; Quality requirement; Stress screening;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1987.5222393
Filename :
5222393
Link To Document :
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