• DocumentCode
    1354826
  • Title

    R&M 2000 Environmental Stress Screening

  • Author

    Littlefield, John W.

  • Author_Institution
    Reliability and Maintainability Engineering Department; Litton Guidance and Control Systems Division; 5500 Canoga Avenue; Woodland Hills, California 91365 USA.
  • Issue
    3
  • fYear
    1987
  • Firstpage
    335
  • Lastpage
    341
  • Abstract
    This paper is concerned with the impact on the US defense industry of the US Air Force R&M 2000 plan and other efforts for a dramatic improvement in the reliability and life-cycle cost of military systems. The paper generally discusses the aims and techniques of environmental stress screening (ESS) with quantitative examples from experience gained at the Litton Guidance and Control Systems Division.
  • Keywords
    Contracts; Control systems; Costs; Electronic switching systems; Life testing; Mathematical model; Stress control; System testing; Temperature; Thermal stresses; Defect precipitation; Quality requirement; Stress screening;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1987.5222393
  • Filename
    5222393