DocumentCode
1354826
Title
R&M 2000 Environmental Stress Screening
Author
Littlefield, John W.
Author_Institution
Reliability and Maintainability Engineering Department; Litton Guidance and Control Systems Division; 5500 Canoga Avenue; Woodland Hills, California 91365 USA.
Issue
3
fYear
1987
Firstpage
335
Lastpage
341
Abstract
This paper is concerned with the impact on the US defense industry of the US Air Force R&M 2000 plan and other efforts for a dramatic improvement in the reliability and life-cycle cost of military systems. The paper generally discusses the aims and techniques of environmental stress screening (ESS) with quantitative examples from experience gained at the Litton Guidance and Control Systems Division.
Keywords
Contracts; Control systems; Costs; Electronic switching systems; Life testing; Mathematical model; Stress control; System testing; Temperature; Thermal stresses; Defect precipitation; Quality requirement; Stress screening;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1987.5222393
Filename
5222393
Link To Document