Title :
Comment on: Sequential Tests of Hypotheses for System-Reliability Modeled by a 2-Parameter Weibull Distribution
Author_Institution :
Code 5326; Naval Research Laboratory; Washington, DC 20375-5000 USA.
Abstract :
A different point of view is presented on the content of the original paper.
Keywords :
Laboratories; Random variables; Reliability theory; Sequential analysis; Sockets; System testing; Weibull distribution; MIL-STD-781; Repairable system; Weibull distribution; Weibull renewal process;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1987.5222420
