DocumentCode :
1354990
Title :
A Comparison of Several Component-Testing Plans For A Parallel System
Author :
Yan, Jia-Her ; Mazumdar, Mainak
Author_Institution :
University of Pittsburgh, Pittsburgh
Issue :
4
fYear :
1987
Firstpage :
419
Lastpage :
424
Abstract :
We consider a parallel (1-out-of-n:G) system of n components with constant failure rates and treat three different classes of component testing procedures all of which guarantee that the given consumer and producer risks are not exceeded. It is necessary to impose certain restrictions on the magnitude of the unknown failure rates for guaranteeing the producer risk. The three classes of component test procedures use Type-I censoring and use decision rules based on: A) the total number of component failures during the testing periods, B) the number of failures for each individual component, and C) the maximum likelihood estimate of system reliability. Based on the requirement that both the consumer and producer risks lie within specified levels, class A plans exhibit lower testing costs in the selected numerical examples.
Keywords :
Cost function; Hazards; Life estimation; Life testing; Maximum likelihood estimation; Random variables; Reliability theory; Sampling methods; State estimation; System testing; Component testing; Consumer risk; Cost minimization; Life test; Maximum likelihood estimate; Optimization; Parallel system; Producer risk; System reliability; Type-I censoring;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1987.5222428
Filename :
5222428
Link To Document :
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