DocumentCode :
1355123
Title :
Capacitive Degeneration in LC-Tank Oscillator for DCO Fine-Frequency Tuning
Author :
Fanori, Luca ; Liscidini, Antonio ; Castello, Rinaldo
Author_Institution :
Lab. di Microelettronica, Univ. degli Studi di Pavia, Pavia, Italy
Volume :
45
Issue :
12
fYear :
2010
Firstpage :
2737
Lastpage :
2745
Abstract :
A digitally controlled oscillator (DCO) that achieves a minimum frequency quantization step of 150 Hz without any dithering is presented. The fine digital tuning is obtained through a capacitive degeneration of a portion of the transistor switching pair used in a classical LC-tank oscillator. The new tuning circuitry does not appreciably affect the intrinsic oscillator phase noise and allows to trim the frequency with a programmable resolution for calibration and multi-standard operation. A prototype integrated in 65 nm CMOS technology exhibits a phase noise of @ 1 MHz drawing 16 mA from a supply of 1.8 V, resulting in a FoM of 183 dBc/Hz. The active area is 700 450.
Keywords :
CMOS integrated circuits; circuit noise; circuit tuning; oscillators; phase noise; quantisation (signal); CMOS technology; DCO fine-frequency tuning; LC-tank oscillator; capacitive degeneration; current 16 mA; digitally controlled oscillator; fine digital tuning; frequency quantization; intrinsic oscillator phase noise; size 65 nm; transistor switching pair; voltage 1.8 V; Capacitance; Digital-controlled oscillators; GSM; Phase noise; Q factor; Tuning; ADPLL; DCO; GSM; LC-tank oscillator; capacitance shrinking; digitally controlled oscillator; fine tuning;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2077190
Filename :
5605274
Link To Document :
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