Title :
Real-time VLBI systems using STM-1 and -16 ATM networks
Author :
Kiuchi, H. ; Hama, S. ; Takahashi, Y. ; Kaneko, A. ; Koyama, Y. ; Kondo, T.
Author_Institution :
Commun. Res. Lab., Koganei, Japan
fDate :
5/1/2000 12:00:00 AM
Abstract :
The Communications Research Laboratory has developed two highly precise VLBI systems using high-speed asynchronous transfer mode (ATM) networks with AAL1 corresponding to the constant bit-rate protocol. Instead of being recorded on magnetic tape, the observed data is transmitted through either a 2.488 Gbit/s STM-16 (in synchronous digital hierarchy)/OC-48 (in synchronous optical network) or a 155.52 Mbit/s STM-1/OC-3 ATM network so that cross-correlation processing and data observation are simultaneous. The STM-16 system was specially designed for the Keystone Project measuring crustal deformation in the Tokyo metropolitan area. STM-16 is not a commercial-grade ATM network but only a backbone line, while STM-1 is spread throughout Japan. The STM-I system was designed considering not only optical fibre links but also satellite links for future international real-time VLBI experiments and it supports burst-mode data transfer by using a 4 Gbit buffer at each station. Both real-time systems and a tape-based system tested simultaneously using the Keystone network, and the differences between the results were within the formal error
Keywords :
Earth crust; asynchronous transfer mode; geodesy; geophysical equipment; optical fibre networks; protocols; radiowave interferometry; satellite communication; synchronous digital hierarchy; tectonics; 155.52 Mbit/s; 2.488 Gbit/s; AAL1; Japan; Keystone Project; STM-1 ATM networks; STM-1/OC-3 ATM network; STM-16 ATM networks; STM-16/OC-48 ATM network; Tokyo metropolitan area; burst-mode data transfer; constant bit-rate protocol; cross-correlation processing; crustal deformation; high-speed asynchronous transfer mode networks; optical fibre links; real-time VLBI systems; satellite links; synchronous digital hierarchy; synchronous optical network;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:20000241