Title :
Reliability Modeling & Evaluation for Networks under Multiple & Fluctuating Operational Conditions
Author :
Yuan, John ; Lin, Chin-Hu ; Chang, Say Jau ; Lai, Shen-Hua
Author_Institution :
Institute of Industrial Engineering; National Tsing Hua University; Hsinchu 300 TAIWAN.
Abstract :
A simple multistate Markov process models a component and a system of any configuration under several operational conditions. Based on it, a simple tie-set approach calculates availability and frequencies-of-system-failure during different conditions; a cut-set approach calculates probabilities and frequencies of system-failure during various conditions. There are two interpretations of operational conditions: 1) environment such as weather or stress, and 2) operating conditions such as occur in several sequential or fluctuating phases. As the system is assumed at any moment under a condition with a certain probability or weight, some relative reliability measures can be further obtained simply to identify which conditions are disastrous.
Keywords :
Availability; Ducts; Frequency; Laboratories; Markov processes; Power system modeling; Power system reliability; Probability; Steady-state; Stress; Availability; Boolean product events; Cut-set; Failure frequency; Induction method; Markov process; Multiple operating conditions; Repair frequency; Repair rate; Tie-set;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1987.5222471