• DocumentCode
    1355378
  • Title

    Fast Node Merging With Don´t Cares Using Logic Implications

  • Author

    Chen, Yung-Chih ; Wang, Chun-Yao

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    29
  • Issue
    11
  • fYear
    2010
  • Firstpage
    1827
  • Lastpage
    1832
  • Abstract
    Node merging is a popular and effective logic restructuring technique that has recently been applied to minimize logic circuits. However, in the previous satisfiability (SAT)-based methods, the search for node mergers required trial-and-error validity checking of a potentially large set of candidate mergers. Here, we propose a new method, which directly identifies node mergers using logic implications without any SAT solving calls. Although the efficiency benefits of the method come at the expense of quality, we further engage the redundancy removal and the wire replacement techniques to enhance its quality. The experimental results show that the proposed optimization method achieves approximately 46 times the speedup while possessing a competitive capability of circuit minimization compared to the state-of-the-art method.
  • Keywords
    circuit optimisation; logic circuits; minimisation; circuit minimization; don´t cares; fast node merging; logic circuits; logic implications; logic restructuring technique; optimization method; redundancy removal; trial-and-error validity checking; wire replacement techniques; Benchmark testing; Circuit faults; Computational modeling; Corporate acquisitions; Integrated circuit modeling; Logic gates; Wire; Algorithms; circuit optimization; node merging; observability don´t cares (ODCs);
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2010.2058510
  • Filename
    5605316