Title :
Unit-Distance Error-Checking Codes
Author_Institution :
Stanford Res. Inst., Menlo Park, Calif.
fDate :
6/1/1958 12:00:00 AM
Keywords :
Binary codes; Circuit faults; Computer errors; Counting circuits; Electrical fault detection; Fault detection; Flip-flops; Logic circuits; Relays;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1958.5222529
