DocumentCode
1355988
Title
Damage-induced spectral perturbations in multilongitudinal-mode semiconductor lasers
Author
De Chiaro, L.F.
Author_Institution
Bell Commun. Res., Red Bank, NJ
Volume
8
Issue
11
fYear
1990
fDate
11/1/1990 12:00:00 AM
Firstpage
1659
Lastpage
1669
Abstract
Mechanical stressing was applied to commercial Fabry-Perot semiconductor lasers to create damage at controlled locations along the optic axis. This damage induces spectral perturbations sinusoidal in wavelength space whose periods are inversely proportional to the distance from the damage to the nearest facet. Experimental and theoretical evidence is presented for a new spectrum-based analytical technique which can provide quantitative information on the location and relative absorption strength of damage sites within the active region. Applications and limitations of this new technique are discussed
Keywords
laser beams; laser cavity resonators; laser modes; piezo-optical effects; semiconductor junction lasers; active region; commercial Fabry-Perot semiconductor lasers; controlled locations; damage induced spectral perturbations; damage sites; location; mechanical stressing; multilongitudinal-mode semiconductor lasers; nearest facet; optic axis; relative absorption strength; spectrum-based analytical technique; wavelength space; Costs; Degradation; Equations; Failure analysis; Gallium arsenide; Laser modes; Optical control; Power lasers; Semiconductor lasers; Wavelength measurement;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.60562
Filename
60562
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