• DocumentCode
    1355988
  • Title

    Damage-induced spectral perturbations in multilongitudinal-mode semiconductor lasers

  • Author

    De Chiaro, L.F.

  • Author_Institution
    Bell Commun. Res., Red Bank, NJ
  • Volume
    8
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1659
  • Lastpage
    1669
  • Abstract
    Mechanical stressing was applied to commercial Fabry-Perot semiconductor lasers to create damage at controlled locations along the optic axis. This damage induces spectral perturbations sinusoidal in wavelength space whose periods are inversely proportional to the distance from the damage to the nearest facet. Experimental and theoretical evidence is presented for a new spectrum-based analytical technique which can provide quantitative information on the location and relative absorption strength of damage sites within the active region. Applications and limitations of this new technique are discussed
  • Keywords
    laser beams; laser cavity resonators; laser modes; piezo-optical effects; semiconductor junction lasers; active region; commercial Fabry-Perot semiconductor lasers; controlled locations; damage induced spectral perturbations; damage sites; location; mechanical stressing; multilongitudinal-mode semiconductor lasers; nearest facet; optic axis; relative absorption strength; spectrum-based analytical technique; wavelength space; Costs; Degradation; Equations; Failure analysis; Gallium arsenide; Laser modes; Optical control; Power lasers; Semiconductor lasers; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.60562
  • Filename
    60562