DocumentCode :
13560
Title :
Channel Model for the Surface Ducts: Large-Scale Path-Loss, Delay Spread, and AOA
Author :
Dinc, Ergin ; Akan, Ozgur B.
Author_Institution :
Dept. of Electr. & Electron. Eng., Koc Univ., Istanbul, Turkey
Volume :
63
Issue :
6
fYear :
2015
fDate :
Jun-15
Firstpage :
2728
Lastpage :
2738
Abstract :
Atmospheric ducts, which are caused by the rapid decrease in the refractive index of the lower atmosphere, can trap the propagating signals. The trapping effects of the atmospheric ducts can be utilized as a communication medium for beyond-line-of-sight (b-LoS) links. Although the wave propagation and the refractivity estimation techniques for the atmospheric ducts are well studied, there is no work that provides a channel model for the atmospheric ducts. Therefore, we develop a large-scale path-loss model for the surface ducts based on the parabolic equation (PE) methods for the first time in the literature. In addition, we develop a ray-optics (RO) method to analyze the delay spread and angle-of-arrival (AOA) of the ducting channel with the surface ducts. Using the developed RO method, we derive an analytical expression for the effective trapping beamwidth of the transmitter to predict the ranges of the beamwidth that can be trapped by the surface ducts according to the refractivity and the channel parameters.
Keywords :
atmospheric electromagnetic wave propagation; parabolic equations; refractive index; AOA; Atmospheric ducts; angle-of-arrival; beyond-line-of-sight links; delay spread; large-scale path-loss; parabolic equation methods; ray-optics method; refractivity estimation techniques; surface ducts; wave propagation; Atmospheric modeling; Atmospheric waves; Ducts; Mathematical model; Propagation; Refractive index; Surface waves; Communication channels; Delay estimation; Propagation; Ray tracing; Refraction; Surface duct; delay estimation; propagation; ray-tracing; refraction; surface duct;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2015.2418788
Filename :
7078958
Link To Document :
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