• DocumentCode
    1356420
  • Title

    Low-Frequency Noise in Schottky-Barrier-Based Nanoscale Field-Effect Transistors

  • Author

    Clément, Nicolas ; Larrieu, Guilhem ; Dubois, Emmanuel

  • Author_Institution
    Centre Nat. de la Rech. Sci., Inst. for Electron., Villeneuve-d´´Ascq, France
  • Volume
    59
  • Issue
    1
  • fYear
    2012
  • Firstpage
    180
  • Lastpage
    187
  • Abstract
    Investigation of low-frequency noise in nanoscale Schottky-barrier (SB)-based field-effect transistors (SB-FETs) is of prime importance due to its large amplitude in emerging bottom-up devices. In addition, noise can give additional information on charge transport mechanisms. In this paper, we study the 1/f noise in nanoscale silicon-on-insulator SB-FETs. An unexpected feature is the clear contribution of the SB to the noise even if the barrier height is lower than 100 meV. Barrier modulation techniques such as dopant segregation are used to tune the barrier height. We propose a generic formulation for low-frequency noise that is applicable to any diffusive SB-FETs.
  • Keywords
    Schottky barriers; field effect transistors; Schottky barrier-based nanoscale field effect transistors; barrier modulation technique; charge transport mechanism; dopant segregation; low frequency noise; nanoscale Schottky barrier; Charge carrier processes; Logic gates; Low-frequency noise; Schottky diodes; Silicon; Transistors; Low-frequency noise; Schottky barriers (SBs); nanodevices; silicon-on-insulator (SOI);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2169676
  • Filename
    6056559