Title :
Simple Modeling and Identification Procedures for “Black-Box” Behavioral Modeling of Power Converters Based on Transient Response Analysis
Author :
Valdivia, Virgilio ; Barrado, Andrés ; Laazaro, A. ; Zumel, Pablo ; Raga, Carmen ; Fernandez, Camino
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
Abstract :
Today, "black-box" behavioral models of power converters are becoming interesting for system level simulation of power electronics systems. These models can be used to evaluate the response of systems that are composed of commercial converters, since they can be fully parameterized by analyzing the actual converter response. To optimize the required computational resources, these models should be as simple as possible. Furthermore, the identification of the parameters should be carried out easily, looking for simple experiments and straightforward adjusting algorithms. Easy modeling and identification procedures, based on a transient response analysis, are proposed in this paper. Using this method, a large-signal "black-box" behavioral model of a power converter is composed of reduced-order transfer functions, which are identified by analyzing the step response of the converter. Both an actual commercial dc-dc converter and a line-commutated rectifier have been modeled and identified by means of this approach, in order to validate the proposed procedures.
Keywords :
DC-DC power convertors; power electronics; power system simulation; power system transients; rectifiers; black-box behavioral modeling; dc-dc converter; line-commutated rectifier; power converters; power electronics systems; system level simulation; transient response analysis; Analytical models; Computational modeling; Impedance; Mathematical model; Power electronics; Power system analysis computing; Power system modeling; Static power converters; Transient analysis; Transient response; Behavioral modeling; black-box modeling; reduced-order model; system identification;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2009.2030957