DocumentCode :
1356652
Title :
Flatfield Correction Optimization for Energy Selective X-Ray Imaging With Medipix3
Author :
Procz, S. ; Pichotka, M. ; Lübke, J. ; Hamann, E. ; Ballabriga, R. ; Blaj, G. ; Campbell, M. ; Fauler, A. ; Mix, M. ; Zwerger, A. ; Fiederle, M.
Author_Institution :
Freiburger Materialforschungszentrum (FMF), Freiburg, Germany
Volume :
58
Issue :
6
fYear :
2011
Firstpage :
3182
Lastpage :
3189
Abstract :
Pixelated photon counting semiconductor X-ray detectors like the Medipix feature adjustable energy thresholds allowing selective counting of photons of a specified energy. This development permits for energy selective X-ray imaging with advanced material information. Furthermore the photon counting function principle of these detectors allows X-ray imaging with reduced noise, providing contrast improvement in low contrast objects. The aim of this study is to analyze the behavior of the new Medipix3 detector, especially regarding flatfield correction for X-ray imaging applications. First high resolution low contrast X-ray images and energy selective X-ray images acquired with the Medipix3 detector are presented as well in this paper.
Keywords :
X-ray detection; X-ray imaging; photon counting; semiconductor counters; Medipix detectors; X-Ray imaging; adjustable energy thresholds; flatfield correction optimization; photon counting function principle; pixelated photon counter; semiconductor X-ray detectors; semiconductor radiation detectors; Multispectral imaging; Semiconductor radiation detectors; Signal to noise ratio; X-ray detection; X-ray imaging; Multispectral imaging; X-ray detection; semiconductor radiation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2011.2165732
Filename :
6056590
Link To Document :
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