• DocumentCode
    1356663
  • Title

    Special Section on IEEE AUTOTESTCON 2008—The Systems Readiness Technology Conference

  • Author

    Kirkland, Larry V.

  • Volume
    58
  • Issue
    10
  • fYear
    2009
  • Firstpage
    3363
  • Lastpage
    3364
  • Abstract
    The three papers in this special section were originally presented at IEEE AUTOTESTCON 2008 in Salt Lake City, Utah.
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2025460
  • Filename
    5223516