DocumentCode
1356663
Title
Special Section on IEEE AUTOTESTCON 2008—The Systems Readiness Technology Conference
Author
Kirkland, Larry V.
Volume
58
Issue
10
fYear
2009
Firstpage
3363
Lastpage
3364
Abstract
The three papers in this special section were originally presented at IEEE AUTOTESTCON 2008 in Salt Lake City, Utah.
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2009.2025460
Filename
5223516
Link To Document