DocumentCode :
1356663
Title :
Special Section on IEEE AUTOTESTCON 2008—The Systems Readiness Technology Conference
Author :
Kirkland, Larry V.
Volume :
58
Issue :
10
fYear :
2009
Firstpage :
3363
Lastpage :
3364
Abstract :
The three papers in this special section were originally presented at IEEE AUTOTESTCON 2008 in Salt Lake City, Utah.
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2025460
Filename :
5223516
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1356663