Title :
Concurrent Error Detection in Bit-Serial Normal Basis Multiplication Over
Using Multiple Parity Prediction Schemes
Author :
Lee, Chiou-Yng ; Meher, Pramod Kumar ; Patra, Jagdish Chandra
Author_Institution :
Dept. of Comput. Inf. & Network Eng., Lunghwa Univ. of Sci. & Technol., Taoyuan, Taiwan
Abstract :
New bit-serial architectures with concurrent error detection capability are presented to detect erroneous outputs in bit-serial normal basis multipliers over GF(2m) using single and multiple-parity prediction schemes. It is shown that different types of normal basis multipliers could be realized by similar architectures. The proposed architectures can detect errors with nearly 100% probability.
Keywords :
Galois fields; error detection; multiplying circuits; GF(2m); bit-serial normal basis multiplication; concurrent error detection; multiple parity prediction scheme; normal basis multiplier; Concurrent error detection (CED); cryptography; normal basis; parity prediction;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2009.2020593