DocumentCode
1357845
Title
Phase noise on a 2-GHz CMOS LC oscillator
Author
Xie, Dingming ; Forbes, Leonard
Author_Institution
Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume
19
Issue
7
fYear
2000
fDate
7/1/2000 12:00:00 AM
Firstpage
773
Lastpage
778
Abstract
This report describes a successful simulation using HSPICE and comparison with published data of the phase noise on a 2-GHz CMOS inductance-capacitance (LC) oscillator caused by low-frequency flicker noise (1/f noise). The flicker noise, which is determined by measurements on NMOSFETs, is simulated as a sum of sine waves with random phase by using MATLAB, and is finally introduced into the LC oscillator circuit as an HSPICE piecewise linear waveform. The output of LC oscillator in HSPICE is written as a series of points equally spaced in time and then the spectrum is computed by fast Fourier transform (FFT). The simulation results show the phase noise of the voltage-controlled oscillator with different noise coefficient (KF) values in the SPICE models, and demonstrate that the phase noise caused by low-frequency flicker noise has a 1/f3 dependence on the offset frequency. The simulated sideband power spectral density corresponds to the measured values reported in the literature
Keywords
1/f noise; CMOS analogue integrated circuits; SPICE; UHF integrated circuits; UHF oscillators; circuit simulation; fast Fourier transforms; flicker noise; nonlinear network analysis; piecewise linear techniques; voltage-controlled oscillators; 1/f noise; 2 GHz; CMOS LC oscillator; HSPICE; MATLAB; fast Fourier transform; low-frequency flicker noise; offset frequency; phase noise; piecewise linear waveform; simulated sideband power spectral density; sine waves; voltage-controlled oscillator; 1f noise; Circuit noise; Circuit simulation; Low-frequency noise; MATLAB; MOSFETs; Noise measurement; Phase measurement; Phase noise; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.851992
Filename
851992
Link To Document