DocumentCode :
135841
Title :
HMM used for component parameters apportionment
Author :
Addabbo, Tommaso ; Bertocci, Francesco ; Fort, Ada ; Mugnaini, Marco ; Vignoli, Valerio ; Rocchi, Santina ; Shahin, Luay
Author_Institution :
Dept. of Inf. Eng. & Math., Univ. of Siena, Siena, Italy
fYear :
2014
fDate :
11-14 Feb. 2014
Firstpage :
1
Lastpage :
4
Abstract :
This paper deals with the problem of the correct allocation of the reliability failure and repair rates of simple systems composed of two elements only, once the service shop history is fully mapped and theoretical hypothesis on system parameters are available. Actually, the problem of data collection and the management of censored ones is one of the most important affecting both reliability, availability and safety analysis. Usually the design is based on a partial collection of biased and censored field data. To improve the predictions and make them more adherent to actual field system life, in this paper, the authors suggest to implement a simple homogeneous Markov model and compare the transition probabilities with the ones coming from a Hidden Markov Structure (HMS or HM Model). The results obtained allows for retrofitting the supposed system failure and repair rates. In this paper the classical Markov Model approach is presented and compared with the HMM one, on one simple and generalized example. In such framework, parameters apportionment, assumes the meaning of system parameters tuning based on the shop history outcomes to match actual system behavior.
Keywords :
failure analysis; hidden Markov models; maintenance engineering; probability; reliability theory; HM model; HMM; HMS; availability analysis; biased field data; censored data collection; censored data management; censored field data; component parameter apportionment; hidden Markov structure; homogeneous Markov model; reliability analysis; reliability failure allocation; repair rates; retrofitting; safety analysis; service shop history; system behavior; system failure; system parameter tuning; transition probabilities; Hidden Markov models; Instruments; Reliability; Resource management; Apportionment; Availability; Hidden Markov Modeling; Markov Modeling; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multi-Conference on Systems, Signals & Devices (SSD), 2014 11th International
Conference_Location :
Barcelona
Type :
conf
DOI :
10.1109/SSD.2014.6808818
Filename :
6808818
Link To Document :
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