• DocumentCode
    135845
  • Title

    IEEE 342-node low voltage networked test system

  • Author

    Schneider, Klaus ; Phanivong, Phillipe ; Lacroix, Jean-Sebastian

  • Author_Institution
    Pacific Northwest Nat. Lab., Seattle, WA, USA
  • fYear
    2014
  • fDate
    27-31 July 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The IEEE Distribution Test Feeders provide a benchmark for new algorithms to the distribution analysis community. The low voltage network test feeder represents a moderate size urban system that is unbalanced and highly networked. This is the first distribution test feeder developed by the IEEE that contains unbalanced networked components. The 342-node Low Voltage Networked Test System includes many elements that may be found in a networked system: multiple 13.2kV primary feeders, network protectors, a 120/208V grid network, and multiple 277/480V spot networks. This paper presents a brief review of the history of low voltage networks and how they evolved into the modern systems. This paper will then present a description of the 342-Node IEEE Low Voltage Network Test System and power flow results.
  • Keywords
    distribution networks; testing; IEEE 342 node low voltage networked test system; IEEE distribution test feeders; grid network; multiple spot networks; network protectors; primary feeders; unbalanced networked components; Cities and towns; Companies; Fuses; History; Low voltage; Oil insulation; Reliability; distribution; power distribution system analysis; test feeder; unbalanced simulation model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    PES General Meeting | Conference & Exposition, 2014 IEEE
  • Conference_Location
    National Harbor, MD
  • Type

    conf

  • DOI
    10.1109/PESGM.2014.6939794
  • Filename
    6939794