DocumentCode
135845
Title
IEEE 342-node low voltage networked test system
Author
Schneider, Klaus ; Phanivong, Phillipe ; Lacroix, Jean-Sebastian
Author_Institution
Pacific Northwest Nat. Lab., Seattle, WA, USA
fYear
2014
fDate
27-31 July 2014
Firstpage
1
Lastpage
5
Abstract
The IEEE Distribution Test Feeders provide a benchmark for new algorithms to the distribution analysis community. The low voltage network test feeder represents a moderate size urban system that is unbalanced and highly networked. This is the first distribution test feeder developed by the IEEE that contains unbalanced networked components. The 342-node Low Voltage Networked Test System includes many elements that may be found in a networked system: multiple 13.2kV primary feeders, network protectors, a 120/208V grid network, and multiple 277/480V spot networks. This paper presents a brief review of the history of low voltage networks and how they evolved into the modern systems. This paper will then present a description of the 342-Node IEEE Low Voltage Network Test System and power flow results.
Keywords
distribution networks; testing; IEEE 342 node low voltage networked test system; IEEE distribution test feeders; grid network; multiple spot networks; network protectors; primary feeders; unbalanced networked components; Cities and towns; Companies; Fuses; History; Low voltage; Oil insulation; Reliability; distribution; power distribution system analysis; test feeder; unbalanced simulation model;
fLanguage
English
Publisher
ieee
Conference_Titel
PES General Meeting | Conference & Exposition, 2014 IEEE
Conference_Location
National Harbor, MD
Type
conf
DOI
10.1109/PESGM.2014.6939794
Filename
6939794
Link To Document