Title :
Radiation-Hardened Reconfigurable Array With Instruction Roll-Back
Author :
Chalamalasetti, Sai Rahul ; Purohit, Sohan ; Margala, Martin ; Vanderbauwhede, Wim
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
Abstract :
This letter presents the design and evaluation of a coarse grained reconfigurable array, hardened against radiation induced transient errors. The architecture consists of an 8 × 8 array of reconfigurable cells, each provided with a built-in soft error detection and instruction roll-back control. We also present the communication management scheme between the processors in the presence of varying degrees of single event upsets. The impact on throughput while evaluating an 8 × 8 discrete wavelet transform (DWT) and 8 × 8 discrete cosine transform (DCT) are also presented.
Keywords :
discrete cosine transforms; discrete wavelet transforms; error detection; parallel processing; radiation hardening (electronics); reconfigurable architectures; communication management; discrete cosine transform; discrete wavelet transform; instruction roll back control; parallel processing; radiation hardened reconfigurable array; reconfigurable cell; soft error detection; transient error; Discrete cosine transforms; Discrete wavelet transforms; Parallel processing; Radiation hardening; Reconfigurable architectures; Single event upset; Instruction roll-back; parallel processing; reconfigurable systems; soft errors;
Journal_Title :
Embedded Systems Letters, IEEE
DOI :
10.1109/LES.2010.2089428
