• DocumentCode
    1358884
  • Title

    Secular change in characteristics of thyristors used in HVDC valve

  • Author

    Sampei, M. ; Yamada, T. ; Tanabe, S. ; Takeda, H. ; Kobayashi, S.

  • Author_Institution
    Electr. Power Dev. Co. Ltd., Tokyo, Japan
  • Volume
    12
  • Issue
    3
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1159
  • Lastpage
    1167
  • Abstract
    The Hokkaido-Honshu HVDC link entered service in 1979 for the first phase (150 MW, 125 kV-1200 A) and in 1980 for the second phase (300 MW, 250 kV-1200 A) and has since been operating in good condition. In the Kamikita converter station situated on the Honshu side, the thyristor valves for the first and second phases use 1344 thyristors rated 4 kV-1.5 kA. To examine secular changes in the characteristics of thyristors and estimate their life expectancy, we picked up eight thyristors from the thyristor valves, measured the main characteristics and compared measurements with the corresponding values measured before they entered service. Further, two thyristors were subjected to temperature and voltage acceleration tests to check for a change over time of leakage current. From the results of these investigations it was verified that the thyristors that have been in service for 16 years have the characteristics and service life equivalent to those of the new ones. But further investigation is required as to the change of turn-off characteristics
  • Keywords
    HVDC power convertors; leakage currents; life testing; substations; thyristor convertors; 1.5 kA; 1200 A; 125 kV; 150 MW; 250 kV; 300 MW; 4 kV; Hokkaido-Honshu HVDC link; Kamikita converter station; leakage current; life expectancy estimation; temperature tests; thyristor valves; turn-off characteristics; voltage acceleration tests; Cable insulation; Degradation; Dielectrics and electrical insulation; HVDC transmission; Insulation testing; Life estimation; Protection; Safety; Thyristors; Valves;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.636928
  • Filename
    636928