• DocumentCode
    1358916
  • Title

    A new eigen-sensitivity theory of augmented matrix and its applications to power system stability analysis

  • Author

    Nam, Hae-Kon ; Kim, Yong-Ku ; Shim, Kwan-Shik ; Lee, Kwang Y.

  • Author_Institution
    Dept. of Electr. Eng., Chonnam Nat. Univ., Kwangju, South Korea
  • Volume
    15
  • Issue
    1
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    363
  • Lastpage
    369
  • Abstract
    In this paper, a new second-order eigen-sensitivity and perturbation theory of the augmented matrix is developed using of only dominant eigenvalues and their left and right-eigenvectors. Eigen-sensitivities on various system and control parameters are computed for the analysis of small signal and voltage stability of the New England power system. It is also shown that the sensitivity analysis may be used as an invaluable tool for analysis, planning, and operation of power systems: identification of the cause of the stability problems and weak lines; optimal tuning of control parameters; determining locations of compensating devices for stability enhancement such as capacitor compensation and FACTS devices
  • Keywords
    control system analysis; eigenvalues and eigenfunctions; matrix algebra; perturbation theory; power system control; power system stability; sensitivity analysis; FACTS devices; augment matrix eigen-sensitivity theory; capacitor compensation; control simulation; dominant eigenvalues; eigenvectors; optimal control parameters tuning; perturbation theory; power system stability analysis; sensitivity analysis; small-signal stability; stability enhancement; stability problems identification; voltage stability; weak lines identification; Control systems; Eigenvalues and eigenfunctions; Power system analysis computing; Power system control; Power system planning; Power system stability; Power systems; Signal analysis; Stability analysis; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.852145
  • Filename
    852145